The All-in-One probes offer four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode.
NEW » AFM Probe Model AIO All-In-One: AFM probe with four different cantilever types on a single chip.
Without Any Coatings
NEW » AFM Probe Model AIO-Al All-In-One-Al: AFM probe with four different cantilever types on a single chip. With Aluminium Reflex Coating
