AFM probes, All-In-One AFM probe, AFM Cantilever

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	AFM Probe Model: AIO
	application:	Several Measurement Modes

	general:	Rotated Monolithic Silicon Probe Symmetric Tip Shape Chipsize: 3.4 x 1.6 x 0.3 mm

	coating:	none

	technical data:	This probe uses “on scan angle” symmetric tips to provide a more symmetric representation of features over 200 nm.

The All-in-One probes offer four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode. The resonance frequencies and force constants are similar to the ones of the well-established models Contact, Multi75, Tap150 and Tap300.

The long cantilevers A for contact mode and B for force modulation are located at one end of the chip while the short cantilevers C for soft tapping and D for tapping mode are located at the opposite end. The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

Cantilever	Application	Similar to	Cantilever specs
			Typical values	Range
A	Contact Mode	Contact	Lenght
			500 μm	+/- 10 μm
			Mean Width
			30 μm	+/- 5 μm
			Thickness
			2.7 μm	+/- 1 μm

B	Force modulation, Pulsed Force Mode	Multi75	Lenght
			210 μm	+/- 10 μm
			Mean Width
			30 μm	+/- 5 μm
			Thickness
			2.7 μm	+/- 1 μm

C	Soft Tapping Mode, Intermittent Contact-Mode	Tap150-G	Lenght
			150 μm	+/- 10 μm
			Mean Width
			30 μm	+/- 5 μm
			Thickness
			2.7 μm	+/- 1 μm

D	Tapping Mode, Intermittent Contact-Mode	Tap300	Lenght
			100 μm	+/- 10 μm
			Mean Width
			50 μm	+/- 5 μm
			Thickness
			2.7 μm	+/- 1 μm

Part of NanoWorld Group

AFM Probe Model: AIO