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Conductive AFM probes
AFM probe Model ElectriCont - AFM Tip
AFM probe Model ElectriCont

AFM Probe Model: ElectriCont

  application:  Contact Mode and
electric modes measurements
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
  coating:  Electrically conductive coating
AFM probe Model ElectriCont - AFM Tip The AFM tip is micromachined, monolithic Silicon probe, exhibiting excellent uniformity and a sharp tip radius. The consistent tip radius of less than 25 nm gives good resolution and reproducibility.

This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200 nm.
2007 © BudgetSensors, made by ISB Web division Part of NanoWorld Group
Electric Modes Measurements:
. Scanning Capacitance Microscopy (SCM),
. Electrostatic Force Microscopy (EFM),
. Kelvin probe Force Microscopy (KFM),
. Scanning probe lithography
. Other Electric Modes
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.