Multi75GB-G Force Modulation AFM Probe with Gold Overall Coating


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Quantity
Multi75GB-G-10 (10 per set)
1 x 260.00 USD = 260.00 USD
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Multi75GB-G-50 (50 per set)
1 x 1 080.00 USD = 1 080.00 USD
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* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
25 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
3 µm (2 - 4 µm)*
* typical range

Coating

Overall gold coating, 70 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM) in air and liquids.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Not recommended for electric applications on abrasive sample surfaces!

Consistent high quality at a lower price!

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