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AFM Probe Model: Multi75DLC |
| application: |
Force Modulation,
Pulsed Force Mode (PFM) |
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| general: |
Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
Alignment Grooves |
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| coating: |
Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating on detector side of the cantilever; 30 nm thick |
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technical
data: |
Resonant Frequency - 75 kHz
Force Constant - 3 N/m |
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The AFM cantilever is micromachined, monolithic Silicon, exhibiting excellent uniformity.
It provides high quality imaging for all standard atomic force microscopes (AFMs). |
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