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Magnetic Force Microscopy (MFM)
AFM Probe Model: MagneticMulti75-G - AFM Cantilever
AFM Probe Model: MagneticMulti75-G

AFM Probe Model: MagneticMulti75-G

  application:  Magnetic Force Microscopy (MFM)
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

Alignment Grooves
  coating:  Tip side - Magnetic
Detector side - Aluminium
AFM Probe Model: MagneticMulti75-G - AFM Cantilever The AFM cantilever is micromachined, monolithic Silicon, exhibiting excellent uniformity.
It provides high quality imaging for all standard atomic force microscopes (AFMs).
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