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Conductive AFM probes
AFM probe Model ElectriMulti75 - AFM Holder Chip
AFM Probe Model ElectriMulti75

AFM Probe Model: ElectriMulti75

  application:  Force Modulation,
Pulsed Force Mode (PFM)
and electric modes measurements
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
  coating:  Electrically conductive coating
AFM probe Model ElectriMulti75 - AFM Holder Chip The AFM Holder Chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
2007 © BudgetSensors, made by ISB Web division Part of NanoWorld Group
Electric Modes Measurements:
. Scanning Capacitance Microscopy (SCM),
. Electrostatic Force Microscopy (EFM),
. Kelvin probe Force Microscopy (KFM),
. Scanning probe lithography
. Other Electric Modes
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.