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AFM Probe Model: Multi75DLC |
| application: |
Force Modulation,
Pulsed Force Mode (PFM) |
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| general: |
Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
Alignment Grooves |
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| coating: |
Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating on detector side of the cantilever, 30 nm thick |
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technical
data: |
Resonant Frequency - 75 kHz
Force Constant - 3 N/m |
|
|
value |
range |
| Resonant Frequency |
75 kHz |
± 15 kHz |
| Force Constant |
3 N/m |
1 N/m to 7 N/m |
| Length |
225 µm |
± 10 µm |
| Mean Width |
28 µm |
± 5 µm |
| Thickness |
3 µm |
± 1 µm |
| Tip Height |
17 µm |
± 2 µm |
| Tip Set back |
15 µm |
± 5 µm |
| Tip Radius |
< 15 nm |
| Reflex Coating |
Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating on detector side of the cantilever, 30 nm thick; |
| Half Cone Angle |
20°-25° along cantilever axis
25°-30° from side
10° at the apex |
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