Harddrive disk surface Compact Disk Surface Veeco Electrostatic Force Microscopy (EFM) test sample. Angs SPM A 100 measurements Collagen DNA DNA Laser Ablation Crater in Sapphire Stressed Silicon Nitride Membrane with Nickel nanoparticles Tap300Al tip: finely detailed surface of biaxially-oriented polypropylene (BOPP) Tap300Al: MgO crystal, carved in a Focused Ion Beam (FIB) system. Crystallization of poly(benzyl-beta-L-glutamate) on glass, 30 micron scan Ion sputtered Silicon Carbide, 1.5 micron scan. Atomic steps on sapphire surface, with defect, 12 micron scan. Dark Chocolate, 15 micron scan. E-coli bacterium with flagellum, 6 micron scan. CNT(2nm) Amyloid-Fibrils Anodized Aluminum nano particles nano particles nano particles Human hair – Scanned in contact mode with Cont AFM probes Atomic steps on a sputtered Palladium, taken with Tap300Al AFM Probe Imprint of different porphyrin aggregates in polystyrene Sample: Silicon doping, AFM Tip: ElectriTap300 The blend of two biopolymers with compatibilizer 200 nm Pitch contact hall Screw dislocation in poly-oxy-methylene (POM)