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Magnetic Force Microscopy (MFM) AFM Probes
AFM probe Model Multi75M-G - AFM Cantilever
AFM probe Model Multi75M-G

MagneticMulti75-G AFM 探针

  适用范围:  磁力显微镜设备(MFM)
  概述:  旋转的单晶硅探针, 对称针尖
芯片尺寸: 3.4×1.6×0.3 mm
调节凹槽
  涂层:  针尖侧上 —磁性覆盖层
探测器侧上—铝覆盖层
AFM probe Model Multi75M-G - AFM Cantilever AFM 悬臂是微制造的单晶硅悬臂。 它具有优良的均匀度。

本产品可以用于所有的标准原子力显微镜（ AFM ）并保证优秀的成像。
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