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AFM probes for Tapping, Intermittent Contact
AFM probe Model Tap300Al - AFM Cantilever
AFM probe Model Tap300Al

Tap300Al AFM 探针

 适用范围:  半接触式、间歇接触式
  概述:  旋转的单晶硅探针，对称针尖
支架尺寸：3.4×1.6×0.3 mm
  涂层:  30nm厚的铝反射涂层
技术数据:  振动频率300 kHz
力常数40 N/m
AFM probe Model Tap300Al - AFM Cantilever AFM 悬臂是微制造的单晶硅悬臂。 它具有优良的均匀度。

本产品可以用于所有的标准原子力显微镜（ AFM ）并保证优秀的成像。
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