BudgetSensors AFM Probes
english | español |
sitemap home
AFM Probe Tip
spacer
Quality AFM Probes
home news products distributors gallery downloads contact us
BudgetSensors's AFM probes on-line shop
AFM probes for Tapping Mode, Intermittent Contact Mode
Force Modulation AFM probes
AFM probes for Contact Mode
Conductive AFM probes
Silicon Nitride AFM probes
Gold Coated AFM probes
Magnetic AFM probes
DLC Probes
All-In-One Probes
Calibration Standards
BudgetComboBox
Magnetic Force Microscopy (MFM)
AFM probe Model MagneticMulti75-G Order Online
AFM Probe Model: MagneticMulti75-G

AFM Probe Model: MagneticMulti75-G

  application:  Magnetic Force Microscopy (MFM)
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

Alignment Grooves
  coating:  Tip side - Magnetic
Detector side - Aluminium
value range
Resonant Frequency 75 kHz ± 15 kHz
Force Constant 3 N/m 1 N/m to 7 N/m
Length 225 µm ± 10 µm
Mean Width 28 µm ± 5 µm
Thickness 3 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 60 nm
Coating Tip Side - Magnetic,
Detector side - Aluminium Reflex
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
2007 © BudgetSensors, made by ISB Web division Part of NanoWorld Group