|
|
 |
AFM Probe Model: SiNi |
| application: |
Soft Contact Mode |
 |
| general: |
4 Silicon Nitride Cantilevers, Triangular, 2 diffrent Lengths (chipsize 3.4 x 1.6 x 0.45 mm) |
 |
| coating: |
70 nm thick Gold/Chromium |
 |
technical data: |
Resonant Frequencies: 30 kHz and 10 kHz Force Constants: 0.27 N/m and 0.06 N/m |
|

SiNi (Si3N4) probes feature 4 cantilevers per chip. The cantilevers' low force constants make these probes ideal for very soft contact mode imaging. |
|
|
|