 |
AFM Probe Model: SiNi |
| application: |
Soft Contact Mode |
 |
| general: |
4 Silicon Nitride Cantilevers,
Triangular, 2 diffrent Lengths
(chipsize 3.4 x 1.6 x 0.45 mm) |
|
| coating: |
70 nm thick Gold/Chromium |
|
technical
data: |
Resonant Frequencies:
30 kHz and 10 kHz
Force Constants:
0.27 N/m and 0.06 N/m |
|
SiNi (Si3N4) probes feature 4 cantilevers per chip.
The cantilevers' low force constants make these probes
ideal for very soft contact mode imaging. |
|
