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AFM Probe Model: SiNi |
| application: |
Soft Contact Mode |
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| general: |
4 Silicon Nitride Cantilevers,
Triangular, 2 diffrent Lengths
(chipsize 3.4 x 1.6 x 0.45 mm) |
|
| coating: |
70 nm thick Gold/Chromium |
|
technical
data: |
Resonant Frequencies:
30 kHz and 10 kHz
Force Constants:
0.27 N/m and 0.06 N/m |
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typical values |
range |
|
short cantilever |
long cantilever |
|
| Resonant Freq. |
30 kHz |
10 kHz |
- |
| Force Constant |
0.27 N/m |
0.06 N/m |
- |
| Lengths |
100 µm |
200 µm |
± 10 µm |
| Widths |
16 µm |
30 µm |
± 5 µm |
| Thickness |
520 nm
(450 nm SiNi + 70 nm coating) |
± 50 nm |
Tip Height
(Wedge Tip) |
12 µm (overall)
> 800 nm (effective) |
± 2 µm
- |
| Double Tip Spacing |
4.5 µm |
± 0.5 µm |
| Tip Radius |
< 15 nm |
| Half-Cone Angles |
35° (macroscopic) |
| Reflex Coating |
70 nm thick Gold/Chromium |
| Cantilever bending |
< 3° |
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