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AFM Probe Model: SiNi |
| application: |
Soft Contact Mode |
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| general: |
4 Silicon Nitride Cantilevers,
Triangular, 2 diffrent Lengths
(chipsize 3.4 x 1.6 x 0.45 mm) |
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| coating: |
70 nm thick Gold/Chromium |
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technical
data: |
Resonant Frequencies:
30 kHz and 10 kHz
Force Constants:
0.27 N/m and 0.06 N/m |
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The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13 deg) which keeps only one tip interacting with the surface if the sample is sufficiently flat (valleys are not deeper than 800 nm). |
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