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AFM probes for Tapping, Intermittent Contact
AFM probe Model Tap300Al-G Order Online: AFM probe Model Tap300Al-G

AFM Probe Model: Tap300Al-G

  application:  Tapping Mode,
Intermittent Contact Mode
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
Alignment grooves
  coating:  Aluminium reflex coating,
30 nm thick
  technical 
data: 
Resonant Frequency - 300 kHz
Force Constant - 40 N/m
value range
Resonant Frequency 300 kHz ± 100 kHz
Force Constant 40 N/m 20 N/m to 75 N/m
Length 125 µm ± 10 µm
Mean Width 30 µm ± 5 µm
Thickness 4 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 10 nm
Reflex Coating Aluminium reflex coating,
30 nm thick
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
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