AFM Cantilever, Conductive AFM probes

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AFM Probe Model: ElectriTap300
application:	Tapping Mode, Intermittent Contact Mode and electric modes measurements

general:	Rotated Monolithic silicon probe Symmetric tip shape Chipsize 3.4 x 1.6 x 0.3 mm

coating:	Electrically conductive coating

AFM probe Model ElectriTap300 - AFM Cantilever

The AFM cantilever is micromachined, monolithic Silicon, exhibiting excellent uniformity.
It provides high quality imaging for all standard atomic force microscopes (AFMs).

Part of NanoWorld Group

Electric Modes Measurements:

. Scanning Capacitance Microscopy (SCM),
. Electrostatic Force Microscopy (EFM),
. Kelvin probe Force Microscopy (KFM),
. Scanning probe lithography
. Other Electric Modes

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Probe Model: ElectriTap300