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AFM Probe Model: Tap300DLC |
| application: |
Tapping Mode,
Intermittent Contact Mode |
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| general: |
Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm |
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| coating: |
Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating on detector side of the cantilever, 30 nm thick |
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technical
data: |
Resonant Frequency - 300 kHz
Force Constant - 40 N/m |
|
|
value |
range |
| Resonant Frequency |
300 kHz |
± 100 kHz |
| Force Constant |
40 N/m |
20 N/m to 75 N/m |
| Length |
125 µm |
± 10 µm |
| Mean Width |
30 µm |
± 5 µm |
| Thickness |
4 µm |
± 1 µm |
| Tip Height |
17 µm |
± 2 µm |
| Tip Set back |
15 µm |
± 5 µm |
| Tip Radius |
< 15 nm |
| Reflex Coating |
Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating on detector side of the cantilever, 30 nm thick; |
| Half Cone Angle |
20°-25° along cantilever axis
25°-30° from side
10° at the apex |
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