|
|
 |
AFM Probe Model: Tap300Al-G |
| application: |
Tapping Mode,
Intermittent Contact Mode |
 |
| general: |
Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
Alignment grooves |
|
| coating: |
Aluminium reflex coating,
30 nm thick |
|
technical
data: |
Resonant Frequency - 300 kHz
Force Constant - 40 N/m |
|
 |
The AFM tip is micromachined, monolithic Silicon probe, exhibiting excellent uniformity and a sharp tip radius. The consistent tip radius of less than 10 nm gives good resolution and reproducibility.
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200 nm. |
|
|
|
