AFM cantilevers, Tapping Mode AFM cantilever, Long Cantilever

english \| español \| customer login

» AFM Tip

» AFM Cantilever

» AFM Holder chip

» Available Package Sizes
and Prices

« Back to product specs

« Back to Conductive Mode
AFM Probes

Download Product Datasheet

AFM Probe Model: ElectriTap190-G
application:	Tapping Mode, Intermittent Contact Mode, Long Cantilever electric modes measurements

general:	Rotated Monolithic silicon probe Symmetric tip shape Chipsize 3.4 x 1.6 x 0.3 mm Alignment Grooves

technical data:	Resonant Frequency - 190 kHz Force Constant - 48 N/m

coating:	Electrically conductive coating

AFM probe Model Tap190-G - AFM Cantilever

The AFM cantilever is micromachined, monolithic Silicon, exhibiting excellent uniformity.
It provides high quality imaging for all standard atomic force microscopes (AFMs).

Part of NanoWorld Group

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

Electric Modes Measurements:

. Scanning Capacitance Microscopy (SCM),
. Electrostatic Force Microscopy (EFM),
. Kelvin probe Force Microscopy (KFM),
. Scanning probe lithography
. Other Electric Modes

AFM Probe Model: ElectriTap190-G