AFM probes, All-In-One-Al-Tl AFM probe, Aluminium Reflex Coating, AFM Cantilever

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	AFM Probe Model: AIOAl-TL
	application:	Several Measurement Modes

	general:	Tipless Monolithic Silicon Probe Chipsize: 3.4 x 1.6 x 0.3 mm

	coating:	Aluminium reflex coating, 30 nm thick

The Tipless All-in-One probes offer four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode. The resonance frequencies and force constants are similar to the ones of the well-established models ContAl, Multi75Al, Tap150Al-G and Tap300Al. However, other than the ContAl , Multi75Al, Tap150Al-G and Tap300Al the Tipless All-in-One cantilevers do not feature a tip.

The long cantilevers A for contact mode and B for force modulation are located at one end of the chip while the short cantilevers C for soft tapping and D for tapping mode are located at the opposite end. The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

Cantilever	Application	Similar to	Cantilever specs
			Typical values	Range
A	Contact Mode	ContAl	Lenght
			500 μm	+/- 10 μm
			Mean Width
			30 μm	+/- 5 μm
			Thickness
			2.7 μm	+/- 1 μm

B	Force modulation, Pulsed Force Mode	Multi75Al	Lenght
			210 μm	+/- 10 μm
			Mean Width
			30 μm	+/- 5 μm
			Thickness
			2.7 μm	+/- 1 μm

C	Soft Tapping Mode, Intermittent Contact-Mode	Tap150Al-G	Lenght
			150 μm	+/- 10 μm
			Mean Width
			30 μm	+/- 5 μm
			Thickness
			2.7 μm	+/- 1 μm

D	Tapping Mode, Intermittent Contact-Mode	Tap300Al	Lenght
			100 μm	+/- 10 μm
			Mean Width
			50 μm	+/- 5 μm
			Thickness
			2.7 μm	+/- 1 μm

Part of NanoWorld Group

AFM Probe Model: AIOAl-TL