SiNi Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip


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SiNi-10 (10 per set)
1 x 255.00 USD = 255.00 USD
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SiNi-30 (30 per set)
1 x 695.00 USD = 695.00 USD
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SiNi-100 (100 per set)
1 x 2 200.00 USD = 2 200.00 USD
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SiNi-300 (300 per set)
1 x 5 400.00 USD = 5 400.00 USD
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AFM Probe Specifications:

AFM Tip

Shape
Pyramid
Height
12 µm
(10 - 14 µm)*
Radius
15 nm
Half Cone Angle
35° (macroscopic)

4 AFM Cantilevers

Short Cantilever
Triangle
0.27 N/m
30 kHz
100 µm (90 - 110 µm)*
16 µm (11 - 21 µm)*
520 nm (470 - 570 nm)*
Long Cantilever
Triangle
0.06 N/m
10 kHz
200 µm (190 - 210 µm)*
30 µm (25 - 35 µm)*
520 nm (470 - 570 nm)*
* typical range

Coating

Gold/Chromium on detector side of the cantilever, 70 nm thick

Alignment Grooves

none

Additional Info

This competitively priced silicon nitride AFM probe features:

  • 2 silicon nitride AFM cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
  • silicon nitride wedge AFM tip
  • overall AFM tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
  • macroscopic half cone angle of 35°
  • 450 micron thick silicon holder chip

Consistent high quality at a lower price!

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