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AFM probes for Tapping Mode, Intermittent Contact Mode
Force Modulation AFM probes
AFM probes for Contact Mode
Conductive AFM probes
Silicon Nitride AFM probes
Gold Coated AFM probes
Magnetic AFM probes
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Conductive AFM probes
For all our silicon AFM probes,
we offer an electrically conductive Chromium/Platinum coating on both sides of the cantilever.

This coating also enhances the laser reflectivity of the cantilever.

NEW » The latest product addition
to this product group is the ElectriTap190-G, which is a an electrically conductive Tapping Mode AFM probe with long cantilever and
Alignment grooves on the back side
of the holder chip.
All Products in this group are suitable for electric modes like:
• Scanning Capacitance Microscopy (SCM),
• Electrostatic Force Microscopy (EFM),
• Kelvin probe Force Microscopy (KFM),
• Scanning probe lithography
We feature following conductive AFM probe types:

AFM Probe Model ElectriTap300-G
for Tapping, Intermittent Contact and electric modes, Alignment Grooves

AFM Probe Model ElectriTap190-G
for Tapping, Intermittent Contact and electric modes, features long cantilever, Alignment Grooves

AFM Probe Model ElectriMulti75-G
for Force Modulation, Pulsed Force Mode (PFM) and electric modes, Alignment Grooves

AFM Probe Model ElectriCont-G
for Contact Mode and electric modes, Alignment Grooves
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