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AFM probe Model ContDLC Order Online: AFM probe Model ContAl
AFM probe Model ContDLC

AFM Probe Model: ContDLC

  application:  Contact Mode
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
Alignment Grooves
  coating:  Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating
on detector side of the cantilever, 30 nm thick
  technical 
data: 
Resonant Frequency - 13 kHz
Force Constant - 0.2 N/m
value range
Resonant Frequency 13 kHz ± 4 kHz
Force Constant 0.2 N/m 0.07 N/m to 0.4 N/m
Length 450 µm ± 10 µm
Mean Width 50 µm ± 5 µm
Thickness 2 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 15 nm
Reflex Coating Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating
on detector side of the cantilever, 30 nm thick;
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
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