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DLC probes
AFM probe Model Multi75DLC Order Online: AFM probe Model Multi75Al-G
AFM probe Model Multi75DLC

AFM Probe Model: Multi75DLC

  application:  Force Modulation,
Pulsed Force Mode (PFM)
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

Alignment Grooves
  coating:  Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating
on detector side of the cantilever, 30 nm thick
  technical 
data: 
Resonant Frequency - 75 kHz
Force Constant - 3 N/m
value range
Resonant Frequency 75 kHz ± 15 kHz
Force Constant 3 N/m 1 N/m to 7 N/m
Length 225 µm ± 10 µm
Mean Width 28 µm ± 5 µm
Thickness 3 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 15 nm
Reflex Coating Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating
on detector side of the cantilever, 30 nm thick;
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
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