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Magnetic Force Microscopy (MFM)
AFM probe Model MagneticMulti75-G Order Online
AFM Probe Model: MagneticMulti75-G

AFM Probe Model: MagneticMulti75-G

  application:  Magnetic Force Microscopy (MFM)
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

Alignment Grooves
  coating:  Tip side - Magnetic
Detector side - Aluminium
value range
Resonant Frequency 75 kHz ± 15 kHz
Force Constant 3 N/m 1 N/m to 7 N/m
Length 225 µm ± 10 µm
Mean Width 28 µm ± 5 µm
Thickness 3 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 60 nm
Coating Tip Side - Magnetic,
Detector side - Aluminium Reflex
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
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