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Silicon Nitride AFM probes
AFM probe Model SiNi Order Online: AFM probe Model SiNi
AFM probe Model SiNi

AFM Probe Model: SiNi

  application:  Soft Contact Mode
  general:  4 Silicon Nitride Cantilevers,
Triangular, 2 diffrent Lengths
(chipsize 3.4 x 1.6 x 0.45 mm)
  coating:  70 nm thick Gold/Chromium
  technical 
data: 
Resonant Frequencies:
  30 kHz and 10 kHz
Force Constants:
  0.27 N/m and 0.06 N/m
typical values range
short cantilever long cantilever
Resonant Freq. 30 kHz 10 kHz -
Force Constant 0.27 N/m 0.06 N/m -
Lengths 100 µm 200 µm ± 10 µm
Widths 16 µm 30 µm ± 5 µm
Thickness 520 nm
(450 nm SiNi + 70 nm coating)
± 50 nm
Tip Height
(Wedge Tip)
12 µm (overall)
> 800 nm (effective)
± 2 µm
-
Double Tip Spacing 4.5 µm ± 0.5 µm
Tip Radius < 15 nm
Half-Cone Angles 35° (macroscopic)
Reflex Coating 70 nm thick Gold/Chromium
Cantilever bending < 3°
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