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AFM probes for Soft Tapping Mode, Intermittent Contact Mode
AFM probe Model ElectriTap190-G Order Online: AFM probe Model ElectriTap190-G
AFM probe Model ElectriTap190-G

AFM Probe Model: ElectriTap190-G

  application:  Tapping Mode,
Intermittent Contact Mode,
Long Cantilever

electric modes measurements
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

Alignment Grooves
  technical 
data: 
Resonant Frequency - 190 kHz
Force Constant - 48 N/m
  coating:  Electrically conductive coating
value range
Resonant Frequency 190 kHz ± 60 kHz
Force Constant 48 N/m 20 N/m to 100 N/m
Length 225 µm ± 12 µm
Mean Width 38 µm ± 9 µm
Thickness 7 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 25 nm
Coating Conductive Cr/Pt on both sides
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
Contact Resistance 300 Ohms on platinum thin film surface
2007 © BudgetSensors, made by ISB Web division Part of NanoWorld Group
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
Electric Modes Measurements:
. Scanning Capacitance Microscopy (SCM),
. Electrostatic Force Microscopy (EFM),
. Kelvin probe Force Microscopy (KFM),
. Scanning probe lithography
. Other Electric Modes