BudgetSensors® AFM Probes
english | español | chinese
sitemap home
AFM Probe Tip
Quality AFM Probes
home news products distributors gallery downloads contact us
BudgetSensors's AFM probes on-line shop
AFM probes for Tapping Mode, Intermittent Contact Mode
Force Modulation AFM probes
AFM probes for Contact Mode
Conductive AFM probes
Silicon Nitride AFM probes
Gold Coated AFM probes
Magnetic AFM probes
DLC Probes
All-In-One Probes
Calibration Standards
AFM probes for Soft Tapping Mode, Intermittent Contact Mode
AFM probe Model ElectriTap190-G Order Online: AFM probe Model ElectriTap190-G
AFM probe Model ElectriTap190-G

AFM Probe Model: ElectriTap190-G

  application:  Tapping Mode,
Intermittent Contact Mode,
Long Cantilever

electric modes measurements
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

Alignment Grooves
Resonant Frequency - 190 kHz
Force Constant - 48 N/m
  coating:  Electrically conductive coating
value range
Resonant Frequency 190 kHz ± 60 kHz
Force Constant 48 N/m 20 N/m to 100 N/m
Length 225 µm ± 12 µm
Mean Width 38 µm ± 9 µm
Thickness 7 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 25 nm
Coating Conductive Cr/Pt on both sides
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
Contact Resistance 300 Ohms on platinum thin film surface
2007 © BudgetSensors, made by ISB Web division Part of NanoWorld Group
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
Electric Modes Measurements:
. Scanning Capacitance Microscopy (SCM),
. Electrostatic Force Microscopy (EFM),
. Kelvin probe Force Microscopy (KFM),
. Scanning probe lithography
. Other Electric Modes