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AFM probe All-In-One Order Online: AFM probe Model SiNi
AFM probe All-In-One

AFM Probe Model: All-In-One-Tipless

  application: 

Several Measurement Modes

  general: 

Tipless Monolithic Silicon Probe
Chipsize: 3.4 x 1.6 x 0.3 mm

  coating:  none

All-In-One The Tipless All-in-One probes offer four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode. The resonance frequencies and force constants of the 4 cantilevers are similar to the ones of the well-established models Contact , Multi75, Tap150 and Tap300 . However, unlike the Contact , Multi75, Tap150 and Tap300 the Tipless All-in-One cantilevers do not feature a tip.

The long cantilevers A for contact mode and B for force modulation are located at one end of the chip while the short cantilevers C for soft tapping and D for tapping mode are located at the opposite end. The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.


Cantilever Application Similar to Short specs
(typical values)
A Contact Mode Contact Res. Frequency:
15 kHz
Force Constant:
0.2 N/m
B Force modulation, Pulsed Force Mode Multi75 Res. Frequency:
80 kHz
Force Constant:
2.7 N/m
C Soft Tapping Mode, Intermittent Contact-Mode Tap150-G Res. Frequency:
150 kHz
Force Constant:
7.4 N/m
D Tapping Mode, Intermittent Contact-Mode Tap300 Res. Frequency:
350 kHz
Force Constant:
40 N/m
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