ElectriCont-G
Contact Mode AFM Probe with Platinum Overall Coating


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Quantity
ContE-G-10 (10 per set)
1 x 240.00 USD = 240.00 USD
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ContE-G-50 (50 per set)
1 x 1 000.00 USD = 1 000.00 USD
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* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 25 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
0.2 N/m (0.07 - 0.4 N/m)*
13 kHz (9 - 17 kHz)*
450 µm (440 - 460 µm)*
50 µm (45 - 55 µm)*
2 µm (1 - 3 µm)*
* typical range

Coating

Electrically Conductive

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as:

  • scanning capacitance microscopy (SCM)
  • scanning probe lithography

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!

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