Contact Mode AFM Probe with Platinum Overall Coating
Request an official quote (RFQ)
Order Code / Price*
(10 per set)
1 x 240.00 USD = 240.00
(50 per set)
1 x 1 000.00 USD = 1 000.00
* Does not include VAT or customs duties.
AFM Probe Specifications:
(15 - 19 µm)*
(10 - 20 µm)*
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
(0.07 - 0.4 N/m)*
(9 - 17 kHz)*
(440 - 460 µm)*
(45 - 55 µm)*
(1 - 3 µm)*
* typical range
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
This product features alignment grooves on the back side of the holder chip.
Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as:
- scanning capacitance microscopy (SCM)
- scanning probe lithography
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Consistent high quality at a lower price!