Multi75Al-G

Force Modulation AFM Probe with Aluminum Reflective Coating


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Order Code / Price*
Quantity
Multi75Al-G-10 (10 per set)
1 x 210.00 USD = 210.00 USD
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Multi75Al-G-50 (50 per set)
1 x 890.00 USD = 890.00 USD
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Multi75Al-G-380 (380 per set)
1 x 3 900.00 USD = 3 900.00 USD
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* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 10 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
3 µm (2 - 4 µm)*
* typical range

Coating

Reflex Aluminum

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM).

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated Multi75GD-G or the overall gold coated Multi75GB-G!

Consistent high quality at a lower price!

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