Multi75DLC
Force Modulation AFM Probe with Diamond-Like-Carbon Tip Coating


Order
Request an official quote (RFQ)
Order Code / Price*
Quantity
Multi75DLC-10 (10 per set)
1 x 240.00 USD = 240.00 USD
Add to Basket
Multi75DLC-50 (50 per set)
1 x 1 000.00 USD = 1 000.00 USD
Add to Basket
* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 15 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
3 µm (2 - 4 µm)*
3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
* typical range

Coating

Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick

Additional Info

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM).

High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the cantilever.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

For measurements in liquids please use the back side gold coated Multi75GD-G or the overall gold coated Multi75GB-G!

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.
Loading