Multi75DLC

Force Modulation AFM Probe with Diamond-Like-Carbon Tip Coating


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Quantity
Multi75DLC-10 (10 per set)
1 x 240.00 USD = 240.00 USD
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Multi75DLC-50 (50 per set)
1 x 1 000.00 USD = 1 000.00 USD
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* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 15 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
3 µm (2 - 4 µm)*
* typical range

Coating

Hard Diamond-Like-Carbon

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM).

High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the cantilever.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated Multi75GD-G or the overall gold coated Multi75GB-G!

Consistent high quality at a lower price!

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