Force Modulation AFM Probe with Magnetic Tip Coating
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Order Code / Price*
(10 per set)
1 x 240.00 USD = 240.00
(50 per set)
1 x 1 000.00 USD = 1 000.00
* Does not include VAT or customs duties.
AFM Probe Specifications:
(15 - 19 µm)*
(10 - 20 µm)*
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
(1 - 7 N/m)*
(60 - 90 kHz)*
(215 - 235 µm)*
(23 - 33 µm)*
(2 - 4 µm)*
* typical range
Hard magnetic, medium momentum coating on tip side of the cantilever
and aluminium reflex coating on detector side of the cantilever
This product features alignment grooves on the back side of the holder chip.
Monolithic silicon AFM probe for magnetic force microscopy (MFM). The cobalt alloy coated tip has a magnetic moment of roughly 10^-13 emu and coercivity of roughly 300 Oe.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Consistent high quality at a lower price!