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All-In-One-DLC Multipurpose AFM Probe with 4 Different Cantilevers and Diamond-Like-Carbon Tip Coating
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AFM Probe Specifications:
AFM Tip
(15 - 19 µm)*
(10 - 20 µm)*
4 AFM Cantilevers
Coating
Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;Aluminum coating on detector side of the cantilever, 30 nm thick
Alignment Grooves
none
Additional Info
Versatile silicon AFM probe with 4 different AFM cantilevers on a single AFM holder chip. Rotated, monolithic silicon AFM probe with symmetric tip shape for various applications (contact mode, force modulation mode, tapping mode and soft tapping mode).
High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the AFM cantilever.
The rotated AFM tips allow for more symmetric representation of high sample features. The consistent AFM tip radii ensure good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You don't need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.
Please note that the aluminum back side coating is not suitable for measurements in liquids!
Consistent high quality at a lower price!
