SiNi
Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip


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Order Code / Price*
Quantity
SiNi-30 (30 per set)
1 x 379.00 USD = 379.00 USD
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SiNi-100 (100 per set)
1 x 1 200.00 USD = 1 200.00 USD
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SiNi-300 (300 per set)
1 x 3 450.00 USD = 3 450.00 USD
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* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Pyramid
Height
12 µm
(10 - 14 µm)*
Radius
< 15 nm
Half Cone Angle
35° (macroscopic)

4 AFM Cantilevers

Long Cantilever
Triangle
200 µm (190 - 210 µm)*
30 µm (25 - 35 µm)*
520 nm (470 - 570 nm)*
0.06 N/m
10 kHz
Short Cantilever
Triangle
100 µm (90 - 110 µm)*
16 µm (11 - 21 µm)*
520 nm (470 - 570 nm)*
0.27 N/m
30 kHz
* typical range

Coating

Gold/Chromium on detector side of the cantilever, 70 nm thick

Additional Info

This competitively priced silicon nitride AFM probe features:

  • 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
  • silicon nitride wedge tip
  • overall tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
  • macroscopic half cone angle of 35°

Consistent high quality at a lower price!

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