Tap300GB-G
Tapping Mode AFM Probe with Gold Overall Coating


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Order Code / Price*
Quantity
Tap300GB-G-10 (10 per set)
1 x 240.00 USD = 240.00 USD
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Tap300GB-G-50 (50 per set)
1 x 1 000.00 USD = 1 000.00 USD
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* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 25 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
40 N/m (20 - 75 N/m)*
300 kHz (200 - 400 kHz)*
125 µm (115 - 135 µm)*
30 µm (25 - 35 µm)*
4 µm (3 - 5 µm)*
* typical range

Coating

(Au) Overall

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Not recommended for electric applications on abrasive sample surfaces!

Consistent high quality at a lower price!

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