Tapping Mode AFM Probe with Gold Reflective Coating
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Order Code / Price*
(10 per set)
1 x 240.00 USD = 240.00
(50 per set)
1 x 1 000.00 USD = 1 000.00
* Does not include VAT or customs duties.
AFM Probe Specifications:
(15 - 19 µm)*
(10 - 20 µm)*
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
(20 - 75 N/m)*
(200 - 400 kHz)*
(115 - 135 µm)*
(25 - 35 µm)*
(3 - 5 µm)*
* typical range
Gold coating on detector side of the cantilever, 70 nm thick
This product features alignment grooves on the back side of the holder chip.
Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Consistent high quality at a lower price!