ElectriTap190-G
Tapping Mode AFM Probe with Long Cantilever and Platinum Overall Coating


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Quantity
Tap190E-G-10 (10 per set)
1 x 240.00 USD = 240.00 USD
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Tap190E-G-50 (50 per set)
1 x 1 000.00 USD = 1 000.00 USD
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* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 25 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
225 µm (215 - 235 µm)*
38 µm (33 - 43 µm)*
7 µm (6 - 8 µm)*
48 N/m (28 - 75 N/m)*
190 kHz (160 - 220 kHz)*
* typical range

Coating

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as:

  • scanning capacitance microscopy (SCM)
  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KFM)

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

BudgetSensors' Tap190 series features a longer cantilever and it is meant as an alternative to BudgetSensors' Tap300 probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series.

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.
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