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Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
This product features alignment grooves on the back side of the holder chip.
Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as:
The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Consistent high quality at a lower price!