ContAl-G
Contact Mode AFM Probe with Aluminum Reflective Coating


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Order Code / Price*
Quantity
ContAl-G-10 (10 per set)
1 x 210.00 USD = 210.00 USD
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ContAl-G-50 (50 per set)
1 x 890.00 USD = 890.00 USD
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ContAl-G-380 (380 per set)
1 x 3 900.00 USD = 3 900.00 USD
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* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 10 nm
Half Cone Angle
20°-25° along cantilever axis25°-30° from side10° at the apex

AFM Cantilever

Cantilever A
Beam
0.2 N/m (0.07 - 0.4 N/m)*
13 kHz (9 - 17 kHz)*
450 µm (440 - 460 µm)*
50 µm (45 - 55 µm)*
2 µm (1 - 3 µm)*
* typical range

Coating

Reflex Aluminum

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!

Consistent high quality at a lower price!

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