ContAl-G
Contact Mode AFM Probe with Aluminum Reflective Coating


Order
Request an official quote (RFQ)
Order Code / Price*
Quantity
ContAl-G-10 (10 per set)
1 x 210.00 USD = 210.00 USD
Add to Basket
ContAl-G-50 (50 per set)
1 x 890.00 USD = 890.00 USD
Add to Basket
ContAl-G-380 (380 per set)
1 x 3 900.00 USD = 3 900.00 USD
Add to Basket
* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 10 nm
Half Cone Angle
20°-25° along cantilever axis 25°-30° from side 10° at the apex

AFM Cantilever

Cantilever A
Beam
450 µm (440 - 460 µm)*
50 µm (45 - 55 µm)*
2 µm (1 - 3 µm)*
0.2 N/m (0.07 - 0.4 N/m)*
13 kHz (9 - 17 kHz)*
* typical range

Coating

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Additional Info

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.
Loading