Contact Mode AFM Probe with Aluminum Reflective Coating
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Order Code / Price*
ContAl-G-10 (10 per set)
1 x 210.00 USD = 210.00 USD
ContAl-G-50 (50 per set)
1 x 890.00 USD = 890.00 USD
ContAl-G-380 (380 per set)
1 x 3 900.00 USD = 3 900.00 USD
* Does not include VAT or customs duties.
AFM Probe Specifications:
Half Cone Angle
20°-25° along cantilever axis
25°-30° from side
10° at the apex
(0.07 - 0.4 N/m)*
(9 - 17 kHz)*
(440 - 460 µm)*
(45 - 55 µm)*
(1 - 3 µm)*
* typical range
Aluminium reflex coating on detector side of the cantilever, 30 nm thick
Monolithic silicon AFM probe for contact mode and lateral force mode operation.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:
- Bruker / Veeco / Digital Instruments
- Keysight / Agilent / Molecular Imaging
- Asylum Research
- Park Systems
For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!
Consistent high quality at a lower price!
This product features alignment grooves on the back side of the holder chip.