Contact Mode AFM Probe with Gold Overall Coating
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Order Code / Price*
(10 per set)
1 x 240.00 USD = 240.00
(50 per set)
1 x 1 000.00 USD = 1 000.00
* Does not include VAT or customs duties.
AFM Probe Specifications:
(15 - 19 µm)*
(10 - 20 µm)*
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
(0.07 - 0.4 N/m)*
(9 - 17 kHz)*
(440 - 460 µm)*
(45 - 55 µm)*
(1 - 3 µm)*
* typical range
Overall gold coating, 70 nm thick
This product features alignment grooves on the back side of the holder chip.
Monolithic silicon AFM probe for contact mode and lateral force mode operation.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Not recommended for electric applications on abrasive sample surfaces!
Consistent high quality at a lower price!