Contact Mode AFM Probe with Diamond-Like-Carbon Tip Coating
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Order Code / Price*
ContDLC-10 (10 per set)
1 x 240.00 USD = 240.00 USD
ContDLC-50 (50 per set)
1 x 1 000.00 USD = 1 000.00 USD
* Does not include VAT or customs duties.
AFM Probe Specifications:
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
(0.07 - 0.4 N/m)*
(9 - 17 kHz)*
(440 - 460 µm)*
(45 - 55 µm)*
(1 - 3 µm)*
* typical range
Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;
Aluminum coating on detector side of the cantilever, 30 nm thick
Monolithic silicon AFM probe for contact mode and lateral force mode operation.
High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the cantilever.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:
- Bruker / Veeco / Digital Instruments
- Keysight / Agilent / Molecular Imaging
- Asylum Research
- Park Systems
For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!
Consistent high quality at a lower price!
This product features alignment grooves on the back side of the holder chip.