ContDLC Contact Mode AFM Probe with Diamond-Like-Carbon Tip Coating


Order
Request an official quote (RFQ)
Order Code / Price*
Quantity
ContDLC-10 (10 per set)
1 x 360.00 USD = 360.00 USD
Add to Basket
ContDLC-50 (50 per set)
1 x 1 530.00 USD = 1 530.00 USD
Add to Basket
* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
15 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
0.2 N/m (0.07 - 0.4 N/m)*
13 kHz (9 - 17 kHz)*
450 µm (440 - 460 µm)*
50 µm (45 - 55 µm)*
2 µm (1 - 3 µm)*
* typical range

Coating

Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;Aluminum coating on detector side of the cantilever, 30 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the AFM cantilever.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!

Consistent high quality at a lower price!

Loading