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AFM probe Model Contact-G Order Online: AFM probe Model Contact
AFM probe Model Contact-G

AFM Probe Model: Contact-G

  application:  Contact Mode
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
  coating:  none [Al Reflex - optional]
Resonant Frequency - 13 kHz
Force Constant - 0.2 N/m
value range
Resonant Frequency 13 kHz ± 4 kHz
Force Constant 0.2 N/m 0.07 N/m to 0.4 N/m
Length 450 µm ± 10 µm
Mean Width 50 µm ± 5 µm
Thickness 2 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 10 nm
Reflex Coating none
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
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