Contact Mode AFM Probes

Contact-G

Contact Mode AFM Probe
Coating: none
Tip Shape: Rotated
Cantilever:
  • F
    13 kHz
  • C
    0.2 N/m
  • L
    450 µm
ContAl-G
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Contact Mode AFM Probe with Aluminum Reflective Coating
Coating: Reflex Aluminum
Tip Shape: Rotated
Cantilever:
  • F
    13 kHz
  • C
    0.2 N/m
  • L
    450 µm
SiNi

Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip
Coating: Reflex Gold
Tip Shape: Pyramid
Cantilevers: 4
  • F
    30 kHz
  • C
    0.27 N/m
  • L
    100 µm
  • F
    10 kHz
  • C
    0.06 N/m
  • L
    200 µm
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