ElectriMulti75-G
Force Modulation AFM Probe with Platinum Overall Coating


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Quantity
Multi75E-G-10 (10 per set)
1 x 240.00 USD = 240.00 USD
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Multi75E-G-50 (50 per set)
1 x 1 000.00 USD = 1 000.00 USD
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AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 25 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
3.0 µm (2 - 4 µm)*
3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
* typical range

Coating

Electrically Conductive

Additional Info

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:

  • scanning capacitance microscopy (SCM)
  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KFM)

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.
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