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AFM probe Model ElectriMulti75-G Order Online: AFM probe Model ElectriMulti75-G
AFM probe Model ElectriMulti75-G

AFM Probe Model: ElectriMulti75-G

  application:  Force Modulation,
Pulsed Force Mode (PFM)
and
electric modes measurements
  general:  Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

Alignment Grooves
  coating:  Electrically conductive coating
value range
Resonant Frequency 75 kHz ± 15 kHz
Force Constant 3 N/m 1 N/m to 7 N/m
Length 225 µm ± 10 µm
Mean Width 28 µm ± 5 µm
Thickness 3 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 25 nm
Coating Conductive Cr/Pt on both sides
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
Contact Resistance 300 Ohms on platinum thin film surface
2007 © BudgetSensors, made by ISB Web division Part of NanoWorld Group
Electric Modes Measurements:
• Scanning Capacitance Microscopy (SCM),
• Electrostatic Force Microscopy (EFM),
• Kelvin probe Force Microscopy (KFM),
• Scanning probe lithography
• Other Electric Modes
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.