Tap300Al-G
Tapping Mode AFM Probe with Aluminum Reflective Coating


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Quantity
Tap300Al-G-10 (10 per set)
1 x 210.00 USD = 210.00 USD
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Tap300Al-G-50 (50 per set)
1 x 890.00 USD = 890.00 USD
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Tap300Al-G-380 (380 per set)
1 x 3 900.00 USD = 3 900.00 USD
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* Does not include VAT or customs duties.

AFM Probe Specifications:

AFM Tip

Shape
Rotated
Height
17 µm
(15 - 19 µm)*
Setback
15 µm
(10 - 20 µm)*
Radius
< 10 nm
Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
Beam
125 µm (115 - 135 µm)*
30 µm (25 - 35 µm)*
4 µm (3 - 5 µm)*
40 N/m (20 - 75 N/m)*
300 kHz (200 - 400 kHz)*
* typical range

Coating

Reflex Aluminum

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

For measurements in liquids please use the back side gold coated Tap300GD-G or the overall gold coated Tap300GB-G!

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.
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